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Authors
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Year

Iodine-stabilized frequency-doupled Nd:YAG laser for length metrology

Ahola, T.E.; Merimaa, M.; Nyholm, K.
-2001

Geodetic baselines in length metrology

Jokela, J.
-2008

Interferometers for calibration of length standards

Peer-reviewed
Lassila, A.; Ikonen, E.; Riski, K.
Optical engineering1995

Digital calibration certificate in metrology

Peer-reviewed
Mustapää, Tuukka; Wiedenhöfer, Thomas; Brown, Clifford; Viitala, Raine; Nikander, Pekka; Kuosmanen, ...
Proceedings of the 20th International Conference of the European Society for Precision Engineering a...2020

Structural Metrology of SWCNTs by Electron Diffraction

Peer-reviewed
Jiang, Hua; Nasibulin, Albert G.; Brown, David P.; Chassaing, Delphine; Kauppinen, Esko I.
-2007

Metrology of geodetic length. Supplement to Geodetic Operations in Finland 1995-1999

Jokela J.
-1999

Bloch oscillating transistor for quantum quantum metrology

Korhonen, Laura; Puska, Antti; Sarkar, Jayanta; Hassel, Juha; Hakonen, Pertti
-2009

Metrology for industrial quantum communications : the MIQC project

Peer-reviewed
DOI
10.1088/0026-1394/51/6/S267
Rastello, M. L.; Degiovanni, I. P.; Sinclair, A. G.; Küeck, S.; Chunnilall, C. J.; Porrovecchio, G.;...
Metrologia2014

Digital Metrology for the Internet of Things

Peer-reviewed
Open access
DOI
10.1109/GIOTS49054.2020.9119603
Mustapää, Tuukka; Autiosalo, Juuso; Nikander, Pekka; Siegel, Joshua E.; Viitala, Raine
Global Internet of Things Summit2020

Biennial report 2022-2023 : Metrology Research Institute

Open access
Karhu, Juho
Aalto University publication series SCIENCE + TECHNOLOGY2024

Iodine-stabilized frequency-doupled Nd:YAG laser for length metrology

2001

Geodetic baselines in length metrology

2008

Interferometers for calibration of length standards

Peer-reviewed
1995

Digital calibration certificate in metrology

Peer-reviewed
2020

Structural Metrology of SWCNTs by Electron Diffraction

Peer-reviewed
2007

Metrology of geodetic length. Supplement to Geodetic Operations in Finland 1995-1999

1999

Bloch oscillating transistor for quantum quantum metrology

2009

Metrology for industrial quantum communications : the MIQC project

Peer-reviewed
DOI
10.1088/0026-1394/51/6/S267
2014

Digital Metrology for the Internet of Things

Peer-reviewed
Open access
DOI
10.1109/GIOTS49054.2020.9119603
2020

Biennial report 2022-2023 : Metrology Research Institute

Open access
2024